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USPTO Data Jan 1 1976 - Nov 10 2026
10 Patents
#4 in Belcamp, MD
#418 in Maryland
#29,944 in US
#56,228 in the World
Survice Engineering Company
Forward Citations = 20
20 inventors:
Belcamp, MD, United States of America
Survice Engineering Company
Calculating rank
Forward Citations = 20
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20 inventors (with patents filed for the assignee):
Mark Thomas Butkiewicz (6 out of 7 patents)
Robert Eric Baltrusch (5 out of 6 patents)
Shawn Thomas Recker (3 out of 3 patents)
4. Joel Henry Witman (3 out of 3 patents)
5. Harry R Luzetsky (2 out of 3 patents)
6. Pat Hoderny (2 out of 3 patents)
7. Joey Roberts (2 out of 3 patents)
8. Chris Hoderny (2 out of 3 patents)
9. Joseph Murphy (2 out of 3 patents)
10. Paul Aubrey Troth (2 out of 3 patents)
11. Andrew Brown (1 out of 8 patents)
12. Kyle Bates (1 out of 2 patents)
13. Charles Allen Larson (1 out of 1 patent)
14. Kevin Thomas McArdle (1 out of 1 patent)
15. Kyle David Herr (1 out of 2 patents)
10 patents:
Company Overview
Survice Engineering Company, headquartered in Belcamp, Maryland, specializes in providing advanced engineering and technical services primarily for defense and aerospace applications. The company focuses on developing innovative solutions in areas such as modeling and simulation, software development, and systems engineering. Survice is committed to enhancing operational effectiveness through its expertise in technology integration and analysis, serving both government and commercial sectors with a strong emphasis on reliability and performance.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Survice Engineering Company. Retrieved from https://idiyas.com/company/survice-engineering-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]