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USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#4 in Ardsley, NY
#1,747 in New York
#29,892 in US
#56,119 in the World
Supresta LLC
Forward Citations = 7
22 inventors:
Ardsley, NY, United States of America
Supresta LLC
Calculating rank
% Expired Patents = 60.0
Forward Citations = 7
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22 inventors (with patents filed for the assignee):
Sergei Vladimirovich Levchik (3 out of 17 patents)
Danielle Angrand Bright (3 out of 20 patents)
Ronald L Pirrelli (2 out of 11 patents)
4. Paul Y Moy (2 out of 7 patents)
5. Anantha Narayanan Desikan (2 out of 6 patents)
6. Lambertus Antonius De Kleine (2 out of 2 patents)
7. Edward D Weil (2 out of 11 patents)
8. Andrew M Piotrowski (1 out of 16 patents)
9. Qiang Yao (1 out of 5 patents)
10. Eric W Burkhardt (1 out of 9 patents)
11. Antoon Ten Kate (1 out of 1 patent)
12. John Tomko (1 out of 13 patents)
13. Juergen Klaus Seifert (1 out of 1 patent)
14. Vladmir Petrovich Prokopovich (1 out of 1 patent)
15. Elena Alekseevna Murashko (1 out of 1 patent)
10 patents:
Company Overview
Supresta LLC, based in Ardsley, NY, specializes in the development and manufacturing of advanced materials and specialty chemicals. The company focuses on providing innovative solutions across various industries, including coatings, adhesives, and plastics. With a strong emphasis on research and technology, Supresta is dedicated to enhancing product performance and sustainability. Its expertise in material science positions it as a key player in delivering high-quality, tailored solutions to meet diverse customer needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Supresta LLC. Retrieved from https://idiyas.com/company/supresta
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]