Wallingford, CT, United States of America

Strain Measurement Devices, Inc.


USPTO Granted Patents = 13

Trademarks = 1

Forward Citations = 98

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16 inventors (with patents filed for the assignee):

goldMedal Daniel E Shapiro (7 out of 11 patents)

silverMedal Neal Wostbrock (3 out of 4 patents)

bronzeMedal Frederick E Jackson (3 out of 8 patents)

4.  William Easlea (2 out of 2 patents)

5.  Eduard Krutyanskiy (2 out of 2 patents)

6.  Chris Bowman (2 out of 2 patents)

7.  Samuel A Matus (2 out of 2 patents)

8.  Joseph Nord (1 out of 3 patents)

9.  Thomas M Bryant (1 out of 3 patents)

10.  Phillip T Harkawik (1 out of 4 patents)

11.  Danny Shapiro (1 out of 1 patent)

12.  Lingli Liu (1 out of 1 patent)

13.  LingLi Liu (1 out of 1 patent)

14.  Harvey R Johnson (1 out of 1 patent)

15.  Kristin N Rheault (1 out of 1 patent)


13 patents:

Company Overview
Strain Measurement Devices, Inc. is a specialized manufacturer based in Wallingford, Connecticut, focusing on advanced strain measurement technologies. The company develops a range of products including strain gauges, load cells, and related instrumentation designed for various applications in engineering and research. Their expertise spans multiple sectors, providing critical solutions for structural health monitoring, aerospace, and industrial applications. Strain Measurement Devices, Inc. is committed to delivering precision and reliability in measurement solutions.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

13 Patents

#17 in Wallingford, CT

#523 in Connecticut

#23,838 in US

#45,039 in the World

Wallingford, CT (US)
Wallingford, CT, United States of America
Forward Citations = 98

16 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Strain Measurement Devices, Inc.. Retrieved from https://idiyas.com/company/strain-measurement-devices

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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