Company Badge
USPTO Data Jan 1 1976 - Nov 10 2026
10 Patents
#5 in Beachwood, OH
#1,230 in Ohio
#29,944 in US
#56,228 in the World
Sti Licensing Corporation
Forward Citations = 360
12 inventors:
Beachwood, OH, United States of America
Sti Licensing Corporation
Calculating rank
% Expired Patents = 40.0
Trademarks = 19
Forward Citations = 360
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12 inventors (with patents filed for the assignee):
Ronald Bruce Mele (4 out of 17 patents)
Jeffrey Lynn Landis (3 out of 10 patents)
Craig Michael Parkulo (3 out of 17 patents)
4. Jerald Robert Malin (3 out of 4 patents)
5. Matthew Shannon (3 out of 5 patents)
6. Wesley McChord Barbee (3 out of 12 patents)
7. Robert Daniel Williams (2 out of 2 patents)
8. Jerry Allen Phifer (2 out of 12 patents)
9. William Eugene Parson (2 out of 18 patents)
10. Judge Woodrow Morgan, Iii (2 out of 6 patents)
11. Jason M Patterson (1 out of 5 patents)
12. Samuel C Shomstein (1 out of 1 patent)
10 patents:
Company Overview
Sti Licensing Corporation, based in Beachwood, Ohio, specializes in the development and licensing of innovative technologies across various sectors. The company focuses on creating solutions that enhance product functionality and user experience, particularly in the fields of consumer electronics and software applications. With a commitment to advancing technology, Sti Licensing collaborates with industry partners to bring cutting-edge inventions to market, ensuring they meet the evolving needs of consumers and businesses alike.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sti Licensing Corporation. Retrieved from https://idiyas.com/company/sti-licensing
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]