Munich, Germany

Steigerwald Strahltechnik Gmbh


USPTO Granted Patents = 22

Forward Citations = 308

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21 inventors (with patents filed for the assignee):

goldMedal Wilhelm Scheffels (10 out of 10 patents)

silverMedal Karl H Steigerwald (8 out of 8 patents)

bronzeMedal Peter Anderl (5 out of 7 patents)

4.  Dieter Konig (5 out of 9 patents)

5.  Johannes Koy (4 out of 4 patents)

6.  Franz Rappold (3 out of 3 patents)

7.  Walther Hiller (3 out of 3 patents)

8.  Erwin Kappelsberger (2 out of 3 patents)

9.  Karl-Heinz Steigerwald (2 out of 3 patents)

10.  Clauspeter Moench (2 out of 2 patents)

11.  Clauspeter Monch (2 out of 3 patents)

12.  Monika Geffcken (1 out of 1 patent)

13.  Joachim Geissler (1 out of 1 patent)

14.  Alfred Von Walter (1 out of 1 patent)

15.  Dietor Konig (1 out of 1 patent)


22 patents:

Company Overview
Steigerwald Strahltechnik GmbH, based in Munich, specializes in advanced surface treatment technologies, particularly in the field of shot peening and surface finishing. The company focuses on enhancing the durability and performance of components across various industries, including aerospace, automotive, and manufacturing. With a commitment to innovation, Steigerwald develops tailored solutions that improve material properties and extend the lifespan of critical components, positioning itself as a leader in surface engineering technology.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

22 Patents

#124 in Munich

#2,063 in Germany

#28,782 in the World

Munich, DE
Munich, Germany
Forward Citations = 308

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Steigerwald Strahltechnik Gmbh. Retrieved from https://idiyas.com/company/steigerwald-strahltechnik

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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