Nevers, France

Ste Look


USPTO Granted Patents = 34

Trademarks = 3

Forward Citations = 319

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22 inventors (with patents filed for the assignee):

goldMedal Jean J Beyl (16 out of 43 patents)

silverMedal Daniel Le Faou (14 out of 14 patents)

bronzeMedal Jean Bernard (13 out of 13 patents)

4.  Henri Peyre (13 out of 14 patents)

5.  Christian Campillo (6 out of 6 patents)

6.  Jean-Pierre Mercat (4 out of 10 patents)

7.  Rene Guerreau (4 out of 4 patents)

8.  Louis Andrieu (2 out of 2 patents)

9.  Philippe Buzon (2 out of 2 patents)

10.  Jean-Claude Guitel (2 out of 2 patents)

11.  Patrice Viodet (2 out of 2 patents)

12.  Michel Mercier (2 out of 2 patents)

13.  Roland Bardin (1 out of 9 patents)

14.  Daniel Bontemps (1 out of 2 patents)

15.  Daniel LeFaou (1 out of 1 patent)


Core Competencies:
Ski Binding
Torque Measurement
Cycling Shoe
Safety Device
Ski Brake
Heel Retaining
Foot Holder
Variable Height
Fastening Device
Cross-Country Skiing
Electronic Device
Toe Abutment

34 patents:

Company Overview
Ste Look is a French company based in Nevers, specializing in the development and manufacturing of advanced optical systems and imaging technologies. The organization focuses on creating innovative solutions for various applications, including industrial inspection, medical imaging, and security systems. With a commitment to research and development, Ste Look aims to enhance visual capabilities through cutting-edge technology, serving both local and international markets with high-quality products tailored to meet diverse client needs.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

34 Patents

#3 in Nevers

#648 in France

#19,612 in the World

Nevers, FR
Nevers, France
Forward Citations = 319

22 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ste Look. Retrieved from https://idiyas.com/company/ste-look

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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