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USPTO Data Jan 1 1976 - Oct 13 2026
11 Patents
#123 in Adelheidorf
#3,523 in Germany
#51,761 in the World
Stankiewicz Gmbh
Forward Citations = 192
20 inventors:
Stankiewicz Gmbh
% Expired Patents = 9.1
Forward Citations = 192
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20 inventors (with patents filed for the assignee):
Christoph Kittel (3 out of 7 patents)
Carsten Kliwer (3 out of 3 patents)
Thomas Freser-Wolzenburg (2 out of 2 patents)
4. Eberhard Puschmann (2 out of 2 patents)
5. Hans Kutter-Schrader (2 out of 2 patents)
6. Gerhard Burak (2 out of 4 patents)
7. Hans Walendy (2 out of 3 patents)
8. Edmund Riggers (2 out of 2 patents)
9. Georg-Wilhelm Prahst (1 out of 1 patent)
10. Maik Grossmann (1 out of 1 patent)
11. Torsten Rust (1 out of 1 patent)
12. Ehrenfried Blümel (1 out of 1 patent)
13. Ralph Gerstner (1 out of 1 patent)
14. Cornelia Peters (1 out of 1 patent)
15. Ehrenfried Blumel (1 out of 3 patents)
11 patents:
2. 8080193 - Method for the production of a sound insulation molding with mass and spring (2011-12-20),
Company Overview
Stankiewicz GmbH, based in Adelheidorf, Germany, specializes in the development and manufacturing of high-performance materials and components for various industries. The company focuses on innovative solutions in the fields of plastics and composites, catering to sectors such as automotive, aerospace, and industrial applications. With a commitment to quality and sustainability, Stankiewicz GmbH leverages advanced technologies to enhance product performance and meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Stankiewicz Gmbh. Retrieved from https://idiyas.com/company/stankiewicz
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]