Geneva, Switzerland

Spd Swiss Precision Diagnostics Gmbh

USPTO Granted Patents = 34

% Expired Patents = 5.9


Trademarks = 5

Forward Citations = 509

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24 inventors (with patents filed for the assignee):

goldMedal Paul J Laverack (23 out of 23 patents)

silverMedal James Gani (16 out of 17 patents)

bronzeMedal Sunil Kalbandi (6 out of 6 patents)

4.  Richard Luxton (6 out of 6 patents)

5.  David McCarthy (3 out of 3 patents)

6.  Saji Eapen (3 out of 3 patents)

7.  Robin Brown (2 out of 2 patents)

8.  Balbir Raj (2 out of 5 patents)

9.  Stephen Paul Sharrock (2 out of 13 patents)

10.  Simon Thorne (2 out of 2 patents)

11.  Cecilia Valette (2 out of 2 patents)

12.  Steven Thomas Cronau (1 out of 1 patent)

13.  Eapen Saji (1 out of 1 patent)

14.  Kieran Andrew Lehane (1 out of 1 patent)

15.  Steven Hart (1 out of 1 patent)


Core Competencies:
Assay Device
Testing Device
Pregnancy Test
Ovulation Test
Conductivity Measurement
Pipette Holder
Portable Testing
Display Screen
Graphical User Interface
Compact Testing
Testing Apparatus
Bubble-Forming Means

34 patents:

Company Overview
Spd Swiss Precision Diagnostics GmbH specializes in the development and manufacturing of advanced diagnostic solutions. The company focuses on innovative technologies in the field of in vitro diagnostics, providing high-quality products that enhance patient care and streamline laboratory processes. Based in Geneva, Switzerland, Spd is committed to delivering precision and reliability in diagnostic testing, catering to a global market with a strong emphasis on research and development in medical technology.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

34 Patents

#15 in Geneva

#436 in Switzerland

#19,651 in the World

Geneva, CH
Geneva, Switzerland
Forward Citations = 509

24 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Spd Swiss Precision Diagnostics Gmbh. Retrieved from https://idiyas.com/company/spd-swiss-precision-diagnostics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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