Fletcher, NC, United States of America

Smartrac Technology Fletcher, Inc.


USPTO Granted Patents = 10

% Expired Patents = 30.0


Forward Citations = 93

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14 inventors (with patents filed for the assignee):

goldMedal Lauri Johannes Huhtasalo (3 out of 5 patents)

silverMedal Jun Liu (3 out of 46 patents)

bronzeMedal Sheshi Nyalamadugu (1 out of 62 patents)

4.  Joe Mullis (1 out of 86 patents)

5.  Bobby Leanio (1 out of 10 patents)

6.  Francisco Martinez De Velasco Cortina (1 out of 46 patents)

7.  Manfred Rietzler (1 out of 71 patents)

8.  Jeffrey Zhu (1 out of 12 patents)

9.  Kirk Greefkes (1 out of 3 patents)

10.  Douglas Moran (1 out of 5 patents)

11.  Gary Bann (1 out of 10 patents)

12.  Thomas Tahan (1 out of 18 patents)

13.  John B Fairbanks (1 out of 9 patents)

14.  James Robert Kruest (1 out of 25 patents)

15.  William Barr (3 patents)


10 patents:

Company Overview
Smartrac Technology Fletcher, Inc. is a leader in the development and manufacturing of advanced RFID (Radio-Frequency Identification) solutions. The company specializes in innovative products that enhance supply chain efficiency, asset tracking, and inventory management across various industries. With a strong focus on research and technology, Smartrac leverages its expertise to deliver cutting-edge solutions that meet the evolving needs of its global clientele, particularly in sectors such as retail, logistics, and healthcare.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

10 Patents

#1 in Fletcher, NC

#619 in North Carolina

#29,866 in US

#56,047 in the World

Fletcher, NC (US)
Fletcher, NC, United States of America
Forward Citations = 93

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Smartrac Technology Fletcher, Inc.. Retrieved from https://idiyas.com/company/smartrac-technology-fletcher

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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