Forward Citations = 760

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12 inventors (with patents filed for the assignee):

Dan Oz (3 out of 21 patents)

Victor Levin (3 out of 34 patents)

Giora Bernat (3 out of 4 patents)

4. Michael Voloshin (2 out of 4 patents)

5. Yackov Bar-Or (2 out of 3 patents)

6. Yakov Baror (1 out of 1 patent)

7. Amram Aizenfeld (1 out of 1 patent)

8. Golan Salman (1 out of 1 patent)

9. Omer Sheziffi (1 out of 1 patent)

10. Arie Avni (1 out of 2 patents)

11. Avi Raz (1 out of 1 patent)

12. Arie Avny (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 6988988 - Endoscopic inspection using a flexible sleeve (2006-01-24),

2. 6908428 - Sleeve for endoscopic tools (2005-06-21),

3. 6485409 - Propulsion of a probe in the colon using a flexible sleeve (2002-11-26),

4. 6447444 - Video rectoscope (2002-09-10),

5. 5819736 - Viewing method and apparatus particularly useful for viewing the (1998-10-13),

Company Overview

Sightline Technologies Ltd. is a leading provider of advanced machine vision solutions for industrial automation. With over 20 years of experience, Sightline offers cutting-edge inspection and quality control systems to improve production efficiency and product quality. Their innovative technology helps manufacturers in various industries, such as food and beverage, pharmaceutical, and automotive, achieve higher levels of accuracy and consistency in their manufacturing processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#41 in Haifa

#1,200 in Israel

Haifa, Israel

Sightline Technologies Ltd.

Forward Citations = 760

12 inventors:

Dan Oz (3 out of 21 patents)

Victor Levin (3 out of 34 patents)

Giora Bernat (3 out of 4 patents)

4. Michael Voloshin (2 out of 4 patents)

5. Yackov Bar-Or (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sightline Technologies Ltd.. Retrieved from https://idiyas.com/company/sightline-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]