Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
8 Patents
#21 in Tarrytown, NY
#2,108 in New York
#35,954 in US
Siemens Medical Solutions Diagnostics
Forward Citations = 45
13 inventors:
Tarrytown, NY, United States of America
Siemens Medical Solutions Diagnostics
Calculating rank
% Expired Patents = 37.5
Trademarks = 13
Forward Citations = 45
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13 inventors (with patents filed for the assignee):
Gregory A Farrell (1 out of 21 patents)
Thomas Yager (1 out of 11 patents)
A Said El Shami (1 out of 11 patents)
4. James P Albarella (1 out of 33 patents)
5. Surendra Nath Menon (1 out of 3 patents)
6. Cynthia K French (1 out of 13 patents)
7. Nicholas T Stock (1 out of 2 patents)
8. Nazeer H Shareef (1 out of 1 patent)
9. James E Smous (1 out of 1 patent)
10. Willis E Howard, Iii (1 out of 8 patents)
11. David Kleinschmitt (1 out of 5 patents)
12. Juan Felix Roman (1 out of 3 patents)
13. Alexandre M Izmailov (1 out of 27 patents)
8 patents:
Company Overview
Siemens Medical Solutions Diagnostics is a leading provider of diagnostic solutions for healthcare providers worldwide. With a focus on innovation and technology, they offer a wide range of products and services including laboratory diagnostics, point-of-care testing, and molecular diagnostics. Their goal is to improve patient outcomes through accurate and timely diagnosis, helping healthcare professionals make informed decisions. With a commitment to quality and reliability, Siemens Medical Solutions Diagnostics continues to be a trusted partner in the healthcare industry.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Siemens Medical Solutions Diagnostics. Retrieved from https://idiyas.com/company/siemens-medical-solutions-diagnostics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]