Forward Citations = 22

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5 inventors (with patents filed for the assignee):

Alfred Beeler (4 out of 6 patents)

Sergej Toedtli (4 out of 4 patents)

Michael Muller (2 out of 3 patents)

4. Rene Gloor (2 out of 4 patents)

5. Peter Schilling (1 out of 1 patent)

8 patents: Sort by Forward Citations

1. 5295401 - Textile on-line sampling inspection (1994-03-22),

2. 5235852 - Method for measuring yarn strength (1993-08-17),

3. 5210909 - Process for optimizing yarn quality (1993-05-18),

4. 5185639 - Fiber sample holder (1993-02-09),

5. 5074485 - Thread guide (1991-12-24),

6. 5068947 - Separation apparatus (1991-12-03),

7. 5014394 - Method and apparatus for making representative samples of textile fibers (1991-05-14),

8. 4980951 - Method and apparatus for parallelizing fibers (1991-01-01),

Company Overview

Siegfried Peyer Ag is a leading provider of precision engineering solutions. With over 50 years of experience, we specialize in the production of high-quality components for various industries including automotive, aerospace, and medical. Our state-of-the-art facilities and commitment to innovation allow us to deliver superior products tailored to meet our customers' unique needs. We are dedicated to exceeding expectations and fostering long-term partnerships with our clients.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

8 Patents

#5 in Wollerau

#1,223 in Switzerland

Wollerau, Switzerland

Siegfried Peyer Ag

Forward Citations = 22

5 inventors:

Alfred Beeler (4 out of 6 patents)

Sergej Toedtli (4 out of 4 patents)

Michael Muller (2 out of 3 patents)

4. Rene Gloor (2 out of 4 patents)

5. Peter Schilling (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Siegfried Peyer Ag. Retrieved from https://idiyas.com/company/siegfried-peyer-ag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]