Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
7 Patents
#348 in Shanghai
#3,931 in China
Shanghai United Imaging Microelectronics Technology Co., Ltd.
Forward Citations = 1
14 inventors:
Shanghai United Imaging Microelectronics Technology Co., Ltd.
Calculating rank
Forward Citations = 1
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14 inventors (with patents filed for the assignee):
Zhigang Li (3 out of 25 patents)
Rong Wu (3 out of 6 patents)
Qingzhong Zhao (3 out of 3 patents)
4. Chengzhi Li (3 out of 3 patents)
5. Jieyou Zhao (2 out of 2 patents)
6. Longzi Yang (1 out of 11 patents)
7. Yin Tang (1 out of 9 patents)
8. Wenliang Ren (1 out of 1 patent)
9. Jianguo Diao (1 out of 1 patent)
10. Fa Wang (1 out of 2 patents)
11. Mingfeng Chen (1 out of 1 patent)
12. Longheng Luo (1 out of 1 patent)
13. Haichao Zhang (1 out of 1 patent)
14. Yue Liu (1 out of 1 patent)
7 patents:
1. 12433563 - Voltage calibration devices, methods and imaging systems including thereof (2025-10-07),
Company Overview
Shanghai United Imaging Microelectronics Technology Co., Ltd. (SHUIMT) is a leading semiconductor company specializing in the research, development, and production of cutting-edge microelectronics for medical imaging solutions. With a focus on innovation and quality, SHUIMT is committed to providing high-performance, reliable products to the medical industry. Visit our website to learn more about our advanced microelectronics technology.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Shanghai United Imaging Microelectronics Technology Co., Ltd.. Retrieved from https://idiyas.com/company/shanghai-united-imaging-microelectronics-technology-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]