Oconomowoc, WI, United States of America

Sentry Equipment Corporation


USPTO Granted Patents = 18



Trademarks = 9

Forward Citations = 120

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16 inventors (with patents filed for the assignee):

goldMedal Richard R Henszey (5 out of 6 patents)

silverMedal Bruce W Weiss (4 out of 32 patents)

bronzeMedal John C Schadt (4 out of 4 patents)

4.  Eugene R Rommelfaenger (4 out of 4 patents)

5.  Michael D Farrell (3 out of 6 patents)

6.  David Nowak (2 out of 2 patents)

7.  Mark Zeck (2 out of 2 patents)

8.  Nathan Pliska (1 out of 1 patent)

9.  Eric Stolz (1 out of 1 patent)

10.  Jay L Kristola (1 out of 3 patents)

11.  Tanner Hallett (1 out of 1 patent)

12.  Gary K Evans (1 out of 6 patents)

13.  Wilie V Evans (1 out of 2 patents)

14.  Scott E Raether (1 out of 1 patent)

15.  Joseph L Leon (1 out of 4 patents)


18 patents:

Company Overview
Sentry Equipment Corporation, based in Oconomowoc, Wisconsin, specializes in the development and manufacturing of advanced sampling and monitoring solutions for various industries, including water treatment, food and beverage, and pharmaceuticals. The company focuses on providing innovative technologies that enhance process efficiency and ensure product quality. With a commitment to precision and reliability, Sentry Equipment plays a crucial role in helping organizations maintain compliance and optimize operations across diverse applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

Sentry Equipment Corporation USPTO Patent Assignee Logo
18 Patents

#3 in Oconomowoc, WI

#420 in Wisconsin

#17,952 in US

#34,187 in the World

Oconomowoc, WI (US)
Oconomowoc, WI, United States of America
Forward Citations = 120

16 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sentry Equipment Corporation. Retrieved from https://idiyas.com/company/sentry-equipment

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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