Sentron V.o.f.

USPTO Granted Patents = 6

Forward Citations = 856

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8 inventors (with patents filed for the assignee):

Hendrikus C Ligtenberg (2 out of 3 patents)

Jozef G Leuveld (2 out of 2 patents)

Jan Feijen (1 out of 19 patents)

4. Josephus M Otten (1 out of 3 patents)

5. Wilhelmus E Hennink (1 out of 3 patents)

6. Nicolaas F De Rooy (1 out of 1 patent)

7. Hendrik H Vd Vlekkert (1 out of 1 patent)

8. Ate J Meinema (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4858615 - Catheter sensor and memory unit (1989-08-22),

2. 4722348 - Catheter tip pressure transducer (1988-02-02),

3. 4701253 - ISFET-based measuring device and method for correcting drift (1987-10-20),

4. 4691167 - Apparatus for determining the activity of an ion (pIon) in a liquid (1987-09-01),

5. 4672971 - Oxygen sensor (1987-06-16),

6. 4634762 - Conjugates of anticoagulant and protein (1987-01-06),

Company Overview

Sentron V.o.f. is a Dutch company specializing in providing innovative solutions for energy management and optimization. Their services include energy monitoring, control systems, and consultancy for a wide range of industries. With a focus on sustainability and efficiency, Sentron V.o.f. helps their clients reduce costs and minimize their environmental impact. Visit their website to learn more about their offerings and expertise.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#53 in

#972 in Netherlands

NL

Sentron V.o.f.

Forward Citations = 856

8 inventors:

Hendrikus C Ligtenberg (2 out of 3 patents)

Jozef G Leuveld (2 out of 2 patents)

Jan Feijen (1 out of 19 patents)

4. Josephus M Otten (1 out of 3 patents)

5. Wilhelmus E Hennink (1 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sentron V.o.f.. Retrieved from https://idiyas.com/company/sentron-v-o-f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]