For the Inventor, By the Inventor

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Sunnyvale, CA, United States of America

Sensor Control, Inc.

USPTO Granted Patents = 1

Forward Citations = 15

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1 inventor (with patents filed for the assignee):

Herbert L Berman (1 out of 19 patents)

1 patent: Sort by Forward Citations

1. 4823291 - Radiometric measurement of wafer temperatures during deposition (1989-04-18),

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USPTO Data Jan 1 1976 - Dec 30 2025

1 Patents

#861 in Sunnyvale, CA

#28,444 in California

#133,919 in US

Sunnyvale, CA, United States of America

Sensor Control, Inc.

Forward Citations = 15

1 inventor:

Herbert L Berman (1 out of 19 patents)

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