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USPTO Data Jan 1 1976 - Oct 27 2026
12 Patents
#99 in Cincinnati, OH
#1,069 in Ohio
#25,589 in US
#48,235 in the World
Schulte Corporation
Forward Citations = 245
13 inventors:
Cincinnati, OH, United States of America
Schulte Corporation
Calculating rank
% Expired Patents = 8.3
Trademarks = 10
Forward Citations = 245
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13 inventors (with patents filed for the assignee):
Elmer J Kokenge (5 out of 5 patents)
John David Kokenge (5 out of 11 patents)
Christian Richard Trifilio (3 out of 60 patents)
4. Jonathan Doench (2 out of 2 patents)
5. F A Backscheider (2 out of 2 patents)
6. Peter G Schulte (1 out of 3 patents)
7. Bryan Goodpaster (1 out of 1 patent)
8. Steven Egolf (1 out of 1 patent)
9. Stephen R Egolf (1 out of 1 patent)
10. William Carlson (1 out of 1 patent)
11. C William Carlson (1 out of 1 patent)
12. William M Campbell (1 out of 1 patent)
13. F A Bachscheider (1 out of 1 patent)
12 patents:
9. 5626245 - Anchor for securing wire shelving, shelving system, and fastener for same (1997-05-06),
Company Overview
Schulte Corporation, based in Cincinnati, Ohio, specializes in the development and manufacturing of advanced materials and components for various industries. The company focuses on innovative solutions in sectors such as automotive, aerospace, and industrial applications. With a commitment to quality and technological advancement, Schulte Corporation leverages its expertise to deliver high-performance products that meet the evolving needs of its clients, ensuring reliability and efficiency across its diverse offerings.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Schulte Corporation. Retrieved from https://idiyas.com/company/schulte
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]