Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
13 Patents
#1 in Adair, IA
#144 in Iowa
#23,815 in US
#44,988 in the World
Schafer Systems Inc.
Forward Citations = 172
20 inventors:
Adair, IA, United States of America
Schafer Systems Inc.
% Expired Patents = 15.4
Trademarks = 8
Forward Citations = 172
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20 inventors (with patents filed for the assignee):
Christopher E Schafer (7 out of 18 patents)
Ryan B Gruhn (5 out of 5 patents)
Craig Jensen (2 out of 2 patents)
4. Philip R Littler (2 out of 2 patents)
5. Kurt L McCuen (2 out of 2 patents)
6. Michael E Irlmeier (2 out of 2 patents)
7. Douglas Edward DeVries (1 out of 22 patents)
8. Trevor E Meyer (1 out of 3 patents)
9. Daniel J Fahrion (1 out of 1 patent)
10. Kevin A Jankowski (1 out of 1 patent)
11. Dennis J Deyen (1 out of 1 patent)
12. Ryan Littler (1 out of 1 patent)
13. Glenn Miller (1 out of 1 patent)
14. Tim Caltrider (1 out of 1 patent)
15. James F Popelka (1 out of 1 patent)
13 patents:
Company Overview
Schafer Systems Inc. is a specialized manufacturer based in Adair, Iowa, focusing on innovative solutions for the transportation and logistics sectors. The company is known for its expertise in developing advanced cargo management systems, including durable containers and handling equipment designed to optimize efficiency and safety in various applications. With a commitment to quality and performance, Schafer Systems serves a diverse clientele, enhancing operational capabilities across multiple industries.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Schafer Systems Inc.. Retrieved from https://idiyas.com/company/schafer-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]