Livonia, MI, United States of America

Scans Associates, Inc.

Calculating rank
USPTO Granted Patents = 14

Forward Citations = 186

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18 inventors (with patents filed for the assignee):

goldMedal Richard L Smith (8 out of 8 patents)

silverMedal Kent Van Allen (4 out of 4 patents)

bronzeMedal Vernon G Converse, Iii (3 out of 3 patents)

4.  Charles E Foerster, Jr (3 out of 3 patents)

5.  James M Bordato (3 out of 3 patents)

6.  Ronald K Mudge (2 out of 4 patents)

7.  Peter J Mosher (2 out of 2 patents)

8.  Aldren M Pace (2 out of 2 patents)

9.  Robert E Miller (2 out of 2 patents)

10.  Theodore R Bott (2 out of 2 patents)

11.  Leland P Tinkham (1 out of 2 patents)

12.  Edwin Lee Cline (1 out of 7 patents)

13.  Richard C Maisonville (1 out of 1 patent)

14.  Kent V Allen (1 out of 1 patent)

15.  Charles J Norton (1 out of 1 patent)


14 patents:

Company Overview
Scans Associates, Inc. is a technology-driven company based in Livonia, Michigan, specializing in advanced scanning solutions and imaging technologies. The organization focuses on developing innovative products that enhance data capture and processing capabilities across various industries. With a strong emphasis on research and development, Scans Associates aims to provide cutting-edge solutions that improve operational efficiency and accuracy in data management, catering to a diverse clientele in both domestic and international markets.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

14 Patents

#9 in Livonia, MI

#790 in Michigan

#22,344 in US

#42,312 in the World

Livonia, MI (US)
Livonia, MI, United States of America
Forward Citations = 186

18 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Scans Associates, Inc.. Retrieved from https://idiyas.com/company/scans-associates

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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