Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
23 Patents
#1,247 in Tokyo
#2,708 in Japan
#27,736 in the World
Sanwa Shutter Corporation
Forward Citations = 407
45 inventors:
Sanwa Shutter Corporation
Calculating rank
% Expired Patents = 4.3
Forward Citations = 407
Loading Chart...
Loading Chart...
45 inventors (with patents filed for the assignee):
Kenji Yamaguchi (5 out of 52 patents)
Noriaki Tokuyama (5 out of 5 patents)
Yoshitsugu Utsumi (4 out of 4 patents)
4. Kenji Hosoyama (4 out of 4 patents)
5. Masakazu Makino (3 out of 3 patents)
6. Fumitoshi Okazaki (3 out of 3 patents)
7. Masato Hirao (3 out of 3 patents)
8. Masaaki Munekata (3 out of 3 patents)
9. Hideo Hirabayashi (3 out of 10 patents)
10. Atsushi Matsumura (2 out of 27 patents)
11. Yoshihiro Otsuka (2 out of 3 patents)
12. Yasunori Kobayashi (2 out of 8 patents)
13. Kazunobu Fukano (2 out of 2 patents)
14. Kiyoshi Abe (2 out of 27 patents)
15. Takeaki Hamada (2 out of 2 patents)
23 patents:
Company Overview
Sanwa Shutter Corporation, headquartered in Tokyo, specializes in the development and manufacturing of high-quality shutter systems and related products. The company focuses on innovative solutions for residential and commercial applications, emphasizing security, energy efficiency, and aesthetic design. With a commitment to advanced technology, Sanwa Shutter integrates modern materials and engineering practices to enhance the functionality and durability of its offerings, serving a diverse clientele across Japan and beyond.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sanwa Shutter Corporation. Retrieved from https://idiyas.com/company/sanwa-shutter
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]