Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
12 Patents
#7 in Fairlawn, OH
#1,069 in Ohio
#25,557 in US
#48,163 in the World
Rjf International Corporation
Forward Citations = 228
14 inventors:
Fairlawn, OH, United States of America
Rjf International Corporation
Trademarks = 10
Forward Citations = 228
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14 inventors (with patents filed for the assignee):
Richard S Varga (3 out of 5 patents)
Thomas R Szczepanski (3 out of 6 patents)
Robert E Young (2 out of 2 patents)
4. Raymond C Srail (2 out of 6 patents)
5. Daniel C Doan (2 out of 2 patents)
6. Eric Martin Weissman (1 out of 12 patents)
7. John L Baechle (1 out of 1 patent)
8. Tiong H Kuan (1 out of 4 patents)
9. Richard A Glover (1 out of 5 patents)
10. Frederic W Kunig (1 out of 4 patents)
11. Thomas G Knight (1 out of 1 patent)
12. John R Bonser (1 out of 2 patents)
13. Mary E Hopkins (1 out of 1 patent)
14. Jeremy T Kuan (1 out of 1 patent)
12 patents:
Company Overview
Rjf International Corporation, based in Fairlawn, Ohio, specializes in the development and manufacturing of advanced materials and components for various industries. The company focuses on innovative solutions that enhance product performance and reliability, particularly in sectors such as aerospace, automotive, and industrial applications. With a commitment to research and technology, Rjf International aims to deliver high-quality products that meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Rjf International Corporation. Retrieved from https://idiyas.com/company/rjf-international
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]