Old Hickory, TN, United States of America

Reemay, Inc.


USPTO Granted Patents = 13

% Expired Patents = 23.1


Trademarks = 8

Forward Citations = 276

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19 inventors (with patents filed for the assignee):

goldMedal Edward K Willis (3 out of 3 patents)

silverMedal Ronald L Smorada (2 out of 2 patents)

bronzeMedal Leon H Zimmerman (2 out of 4 patents)

4.  Nancy T LaTondress (2 out of 2 patents)

5.  William F Murphy, Jr (2 out of 2 patents)

6.  Price W LaCroix (2 out of 2 patents)

7.  Alvin A Fleck (2 out of 2 patents)

8.  Edward L Brignola (2 out of 2 patents)

9.  Leon H Zimmerman, Deceased (2 out of 2 patents)

10.  Peter J Angelini (1 out of 2 patents)

11.  Clement J Haley (1 out of 5 patents)

12.  Harry Barnes (1 out of 1 patent)

13.  Howell N Smith (1 out of 1 patent)

14.  Gary W Anderson (1 out of 1 patent)

15.  George W Logan (1 out of 1 patent)


13 patents:

Company Overview
Reemay, Inc. is a leading manufacturer specializing in advanced nonwoven fabrics and filtration media. The company focuses on developing innovative solutions for various industries, including automotive, medical, and industrial applications. With a strong emphasis on research and technology, Reemay leverages its expertise to create high-performance materials that meet the evolving needs of its clients. Headquartered in Old Hickory, Tennessee, Reemay is committed to sustainability and quality in its manufacturing processes.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

13 Patents

#2 in Old Hickory, TN

#250 in Tennessee

#23,815 in US

#44,988 in the World

Old Hickory, TN (US)
Old Hickory, TN, United States of America
Forward Citations = 276

19 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Reemay, Inc.. Retrieved from https://idiyas.com/company/reemay

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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