Wilmington, DE, United States of America

Qlt USA, Inc.

Calculating rank

USPTO Granted Patents = 5

% Expired Patents = 40.0

CIPO Patents = 1

EPO Patents = 2

Trademarks = 3

Forward Citations = 79

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5 inventors (with patents filed for the assignee):

Richard L Dunn (2 out of 68 patents)

Cody L Yarborough (2 out of 9 patents)

Dominic G Madril (2 out of 8 patents)

4. Rajan Bawa (2 out of 7 patents)

5. David W Osborne (1 out of 43 patents)

6. Bhagya L Chandrashekar (7 patents)

7. John Steven Garrett (6 patents)

8. Robert William Lathrop (0 patent)

9. Harish Ravivarapu (0 patent)

5 patents: Sort by Forward Citations

1. 8470359 - Sustained release polymer (2013-06-25),

2. 7467482 - Method for lyophilizing an active agent (2008-12-23),

3. 7399462 - Protectant for UV-induced skin damage (2008-07-15),

4. 7128927 - Emulsions for in-situ delivery systems (2006-10-31),

5. 6907679 - Method for lyophilizing an active agent (2005-06-21),

Company Overview

Qlt Usa, Inc. is a leading provider of quality assurance and testing services for various industries. With a focus on delivering top-notch solutions to ensure product safety and compliance, Qlt Usa, Inc. has built a reputation for excellence in the field. Their team of experts utilize cutting-edge technology and methodologies to support clients in achieving their quality goals and objectives.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

5 Patents

#531 in Wilmington, DE

#737 in Delaware

#51,669 in US

Wilmington, DE, United States of America

Qlt USA, Inc.

Forward Citations = 79

5 inventors:

Richard L Dunn (2 out of 68 patents)

Cody L Yarborough (2 out of 9 patents)

Dominic G Madril (2 out of 8 patents)

4. Rajan Bawa (2 out of 7 patents)

5. David W Osborne (1 out of 43 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Qlt USA, Inc.. Retrieved from https://idiyas.com/company/qlt-usa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]