Huntsville, AL, United States of America

Q-Track Corporation

Calculating rank
USPTO Granted Patents = 18

% Expired Patents = 72.2

Forward Citations = 594

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19 inventors (with patents filed for the assignee):

goldMedal Hans Gregory Schantz (18 out of 45 patents)

silverMedal Robert Edward DePierre (9 out of 10 patents)

bronzeMedal David Langford (5 out of 9 patents)

4.  Alfred Hans Unden (3 out of 3 patents)

5.  Eric Alexander Richards (3 out of 3 patents)

6.  Glenn Wolenec (3 out of 4 patents)

7.  Jerome Sylvester Gabig (3 out of 4 patents)

8.  Stephen A Werner (2 out of 2 patents)

9.  Peter Beucher (2 out of 3 patents)

10.  James David Fluhler (2 out of 2 patents)

11.  Kazimierz Siwiak (2 out of 39 patents)

12.  James Matthew Barron (2 out of 2 patents)

13.  Andrew Compston (2 out of 2 patents)

14.  Christopher David Pittman (1 out of 3 patents)

15.  James Lee Richards (1 out of 132 patents)


18 patents:

Company Overview
Q-Track Corporation, based in Huntsville, Alabama, specializes in advanced location and tracking technologies. The company focuses on developing innovative solutions that enhance situational awareness and operational efficiency across various sectors, including defense, healthcare, and industrial applications. By leveraging cutting-edge technologies, Q-Track aims to provide precise tracking capabilities that support critical decision-making processes and improve overall safety and productivity in complex environments.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

18 Patents

#23 in Huntsville, AL

#74 in Alabama

#17,974 in US

#34,244 in the World

Huntsville, AL (US)
Huntsville, AL, United States of America
Forward Citations = 594

19 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Q-Track Corporation. Retrieved from https://idiyas.com/company/q-track

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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