Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
19 Patents
#7 in Oak Ridge, TN
#165 in Tennessee
#17,154 in US
#32,705 in the World
Protomet Corporation
Forward Citations = 62
18 inventors:
Oak Ridge, TN, United States of America
Protomet Corporation
Calculating rank
% Expired Patents = 10.5
Trademarks = 4
Forward Citations = 62
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18 inventors (with patents filed for the assignee):
Jeff S Bohanan (9 out of 13 patents)
William Matthew Reid (8 out of 15 patents)
Stewart Boyd (7 out of 8 patents)
4. Nathan Mellas (4 out of 8 patents)
5. Dale Lee Lambert (4 out of 11 patents)
6. Charles Reeves (4 out of 4 patents)
7. Brian Pitcher (4 out of 4 patents)
8. Alec Stuckey (3 out of 3 patents)
9. Aaron Pierce (3 out of 3 patents)
10. Michael Shane Garner (2 out of 6 patents)
11. Matt Reid (2 out of 2 patents)
12. Lynn Haynes (2 out of 2 patents)
13. Logan Atkins (1 out of 2 patents)
14. William Caden Webb (1 out of 1 patent)
15. Jeff Bohanan (1 out of 1 patent)
19 patents:
Company Overview
Protomet Corporation, based in Oak Ridge, TN, specializes in advanced engineering and manufacturing solutions. The company focuses on developing innovative technologies across various sectors, including aerospace, defense, and medical devices. Protomet is known for its expertise in precision machining, prototyping, and product development, leveraging cutting-edge techniques to meet the needs of its clients. With a commitment to quality and innovation, Protomet plays a significant role in enhancing technological capabilities in its fields of operation.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Protomet Corporation. Retrieved from https://idiyas.com/company/protomet
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]