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For the Inventor, By the Inventor

Sunnyvale, CA, United States of America

Process Diagnostics, Inc.


USPTO Granted Patents = 2

% Expired Patents = 50.0

Forward Citations = 18

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2 inventors (with patents filed for the assignee):

goldMedal Evan Grund (2 out of 8 patents)

silverMedal James A McMillen (2 out of 2 patents)


2 patents:

1. 6900900 - Apparatus and method for enabling high resolution film thickness and thickness-uniformity measurements (2005-05-31),
2. 6900894 - Apparatus and method for measuring dose and energy of ion implantation by employing reflective optics (2005-05-31),
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USPTO Data Jan 1 1976 - Sep 22 2026

2 Patents

#721 in Sunnyvale, CA

#20,966 in California

#94,680 in US

Sunnyvale, CA (US)
Sunnyvale, CA, United States of America

Process Diagnostics, Inc.

Forward Citations = 18

2 inventors:

goldMedal Evan Grund (2 out of 8 patents)

silverMedal James A McMillen (2 out of 2 patents)

Please report any incorrect information to [email protected]
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