Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
17 Patents
#50 in Fort Worth, TX
#1,149 in Texas
#18,903 in US
#35,948 in the World
Probe Technology Services, Inc.
Forward Citations = 110
23 inventors:
Fort Worth, TX, United States of America
Probe Technology Services, Inc.
% Expired Patents = 11.8
EPO Patents = 3
Trademarks = 6
Forward Citations = 110
Loading Chart...
Loading Chart...
23 inventors (with patents filed for the assignee):
Brian Hurst (6 out of 7 patents)
John L Marshall (5 out of 6 patents)
Jun Zhang (4 out of 11 patents)
4. Marvin Beckman (3 out of 4 patents)
5. Roger Archibald (2 out of 10 patents)
6. Yibing Zheng (2 out of 2 patents)
7. Thientu Ho (2 out of 2 patents)
8. Frank Wallace (1 out of 1 patent)
9. Kee Siu (1 out of 1 patent)
10. Mark Lloyd (1 out of 1 patent)
11. Angel Mendoza (1 out of 1 patent)
12. Johnathan Miko (1 out of 1 patent)
13. David S Wesson (1 out of 94 patents)
14. Tony M Small (1 out of 2 patents)
15. David M O'Connor (1 out of 1 patent)
17 patents:
3. 11746643 - Methods and apparatus for cement bond evaluation through production tubing (2023-09-05),
Company Overview
Probe Technology Services, Inc. is a Fort Worth-based company specializing in advanced technology solutions for various industries. The organization focuses on developing innovative systems and services that enhance operational efficiency and performance. With expertise in fields such as aerospace, defense, and telecommunications, Probe Technology Services is committed to delivering high-quality products that meet the evolving needs of its clients. The company emphasizes research and development to stay at the forefront of technological advancements.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Probe Technology Services, Inc.. Retrieved from https://idiyas.com/company/probe-technology-services
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]