Albuquerque, NM, United States of America

Printron, Inc.

Calculating rank

USPTO Granted Patents = 6

Forward Citations = 54

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5 inventors (with patents filed for the assignee):

Burt DeVolk (4 out of 4 patents)

David R Best (2 out of 2 patents)

Gerald A DeVolk (2 out of 2 patents)

4. Eleanor L Schuler (1 out of 31 patents)

5. Kim Krubsack (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 5582104 - Apparatus and process for screen printing (1996-12-10),

2. 5527586 - Apparatus and method for depositing metal particles on a dielectric (1996-06-18),

3. 5405572 - Reduction of oxides from metal powders wherein the de-oxidized powder is (1995-04-11),

4. 5403376 - Particle size distribution for controlling flow of metal powders melted (1995-04-04),

5. 5389408 - Method for curing metal particles into continuous conductors (1995-02-14),

6. 5284189 - Conductive ink packaging for printed circuit board screen printing (1994-02-08),

Company Overview

Printron, Inc. is a leading provider of printing solutions for businesses of all sizes. With over 20 years of experience in the industry, we offer a wide range of high-quality printers, supplies, and maintenance services. Our commitment to innovation and customer satisfaction sets us apart from the competition. Visit our website to learn more about how Printron can meet your printing needs.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

6 Patents

#76 in Albuquerque, NM

#120 in New Mexico

#45,030 in US

Albuquerque, NM, United States of America

Printron, Inc.

Forward Citations = 54

5 inventors:

Burt DeVolk (4 out of 4 patents)

David R Best (2 out of 2 patents)

Gerald A DeVolk (2 out of 2 patents)

4. Eleanor L Schuler (1 out of 31 patents)

5. Kim Krubsack (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Printron, Inc.. Retrieved from https://idiyas.com/company/printron

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]