Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
4 Patents
#60 in Anaheim, CA
#14,051 in California
#60,641 in US
Printrak International Inc.
Forward Citations = 140
12 inventors:
Anaheim, CA, United States of America
Printrak International Inc.
Trademarks = 1
Forward Citations = 140
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12 inventors (with patents filed for the assignee):
Eliseo R Ranalli (3 out of 22 patents)
Daniel J Driscoll (2 out of 2 patents)
Barry G Broome (1 out of 35 patents)
4. Behnam Bavarian (1 out of 4 patents)
5. Douglas F Walker (1 out of 6 patents)
6. Bradley Scott (1 out of 1 patent)
7. John M Tamkin (1 out of 1 patent)
8. Richard M Giles (1 out of 1 patent)
9. Zhen-Ping Peter Lo (1 out of 1 patent)
10. Philip J D'Almada Remedios (1 out of 14 patents)
11. Raymond C Godard (1 out of 1 patent)
12. Gilbert Cardwell (1 out of 1 patent)
4 patents:
Company Overview
Printrak International Inc. is a leading provider of public safety and identification solutions. The company offers a range of products and services, including biometric identification systems, forensic analysis tools, and software for law enforcement agencies. With a focus on innovation and quality, Printrak International Inc. is dedicated to helping customers improve their operational efficiency and enhance public safety.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Printrak International Inc.. Retrieved from https://idiyas.com/company/printrak-international
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]