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USPTO Data Jan 1 1976 - Oct 20 2026
1 Patents
#2 in Cedar Crest, NM 87008, undefined
#451 in
#136,919 in US
Precision Ocular Metrology, LLC
Forward Citations = 9
3 inventors:
Cedar Crest, NM, United States of America
Precision Ocular Metrology, LLC
% Expired Patents = 100.0
EPO Patents = 1
Forward Citations = 9
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3 inventors (with patents filed for the assignee):
Edwin Jay Sarver (1 out of 45 patents)
Scott P Catanzariti (1 out of 1 patent)
Donald R Sanders (1 out of 9 patents)
1 patent:
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Precision Ocular Metrology, LLC. Retrieved from https://idiyas.com/company/precision-ocular-metrology
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]