EPO Patents = 3

Trademarks = 1

Forward Citations = 48

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3 inventors (with patents filed for the assignee):

Christopher Rene Hewson (3 out of 3 patents)

William Frederick Ray (3 out of 14 patents)

Joanne Marie Aberdeen (2 out of 2 patents)

4. William F Ray (0 patent)

5. Christopher R Hewson (0 patent)

6. Joanne M Aberdeen (0 patent)

4 patents: Sort by Forward Citations

1. 10197601 - High bandwidth Rogowski transducer with screened coil (2019-02-05),

2. 9970963 - Temperature compensated current measurement (2018-05-15),

3. 9606152 - Apparatus for current measurement (2017-03-28),

4. 6614218 - Current measuring device (2003-09-02),

Company Overview

Power Electronic Measurements Limited (PEM) is a leading manufacturer of power electronic test and measurement equipment. With over 30 years of experience in the industry, PEM offers a wide range of high-quality products for the power electronics market, including power analyzers, current probes, and precision power supplies. Their innovative solutions are used by industries worldwide to ensure accurate and reliable measurements for their electronic systems.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#1 in Long Eaton

#3,869 in United Kingdom

Long Eaton, United Kingdom

Power Electronic Measurements Limited

Forward Citations = 48

3 inventors:

Christopher Rene Hewson (3 out of 3 patents)

William Frederick Ray (3 out of 14 patents)

Joanne Marie Aberdeen (2 out of 2 patents)

4. William F Ray (0 patent)

5. Christopher R Hewson (0 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Power Electronic Measurements Limited. Retrieved from https://idiyas.com/company/power-electronic-measurements

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]