% Expired Patents = 100.0

EPO Patents = 2

Forward Citations = 14

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4 inventors (with patents filed for the assignee):

Keiji Oka (3 out of 3 patents)

Junji Fukushima (1 out of 1 patent)

Akio Iwama (1 out of 1 patent)

4. Akihiro Yamaguchi (1 out of 213 patents)

4 patents: Sort by Forward Citations

1. 9408752 - X-ray detectable adhesive bandage and method of manufacturing X-ray detectable adhesive bandage (2016-08-09),

2. 9308291 - Medical pressure-sensitive adhesive sheet and method for producing the same (2016-04-12),

3. 7846523 - Laminated body with releasing member and method for manufacturing the same (2010-12-07),

4. 7431985 - Medical pressure-sensitive adhesive composition, process for producing the same, and medical tape (2008-10-07),

Company Overview

Piac Co., Ltd. is a leading technology company specializing in artificial intelligence and big data analytics. We offer innovative solutions for businesses to optimize their operations, improve efficiency, and drive growth. Our team of experts is dedicated to providing cutting-edge technology and exceptional service to our clients worldwide. With a commitment to excellence and a passion for innovation, Piac Co., Ltd. is poised to revolutionize the way businesses harness the power of data to achieve their goals.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#28 in Shiga

#7,579 in Japan

Shiga, Japan

Piac Co., Ltd.

Forward Citations = 14

4 inventors:

Keiji Oka (3 out of 3 patents)

Junji Fukushima (1 out of 1 patent)

Akio Iwama (1 out of 1 patent)

4. Akihiro Yamaguchi (1 out of 213 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Piac Co., Ltd.. Retrieved from https://idiyas.com/company/piac-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]