Clinton, LA, United States of America

Pactec, Inc.

Calculating rank
USPTO Granted Patents = 49

% Expired Patents = 14.3

Trademarks = 16

Forward Citations = 601

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13 inventors (with patents filed for the assignee):

goldMedal Michael R Schilling (25 out of 25 patents)

silverMedal Troy Town (20 out of 21 patents)

bronzeMedal Peter Hedgewick (11 out of 20 patents)

4.  Michael Sanchez (8 out of 8 patents)

5.  Lewis Strickland (8 out of 8 patents)

6.  Douglas S Forrer (5 out of 5 patents)

7.  William Smart (4 out of 4 patents)

8.  Daniel Paul Corn (4 out of 4 patents)

9.  Peter H Hedgewick (4 out of 4 patents)

10.  Derrel Thomas (2 out of 3 patents)

11.  Mark McInnis (1 out of 2 patents)

12.  Mark Day (1 out of 1 patent)

13.  Morris Fred Mintz (1 out of 1 patent)


Core Competencies:
Containment Bag
Lifting Bag
Waste Packaging
Spill Berm
Reflective Pavement Marker
Multi-Layer Filter
Snowplowable Marker
Abrasion Resistant Coating
Road Marker
Storm Drain Liner

49 patents:

Company Overview
Pactec, Inc. is a specialized manufacturer based in Clinton, Louisiana, focusing on innovative solutions for containment and packaging systems. The company develops a range of products designed for the safe handling and storage of hazardous materials, including containment berms, lifting bags, and containment bags. Pactec also addresses environmental concerns with products like storm drain liners and reflective markers, ensuring compliance and safety in various industrial applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

Pactec, Inc. USPTO Patent Assignee Logo
49 Patents

#1 in Clinton, LA

#15 in Louisiana

#7,154 in US

#14,301 in the World

Clinton, LA (US)
Clinton, LA, United States of America
Forward Citations = 601

13 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Pactec, Inc.. Retrieved from https://idiyas.com/company/pactec

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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