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USPTO Data Jan 1 1976 - Oct 13 2026
11 Patents
#5 in Moberly, MO
#387 in Missouri
#27,514 in US
#51,761 in the World
Orscheln Products L.l.c.
Forward Citations = 136
22 inventors:
Moberly, MO, United States of America
Orscheln Products L.l.c.
% Expired Patents = 72.7
Forward Citations = 136
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22 inventors (with patents filed for the assignee):
Wayne Lawrence Soucie (4 out of 22 patents)
Michael Herbert Schmidt (4 out of 6 patents)
Curtis H Porter (4 out of 8 patents)
4. John Michael Dougherty (4 out of 4 patents)
5. Jeffrey Earl Tayon (3 out of 11 patents)
6. Steven Marek (3 out of 3 patents)
7. Larry Brian Champ (2 out of 9 patents)
8. Jeffrey J Pendleton (2 out of 2 patents)
9. Matthew Aaron Nevels (2 out of 2 patents)
10. Karen S Slabaugh (2 out of 2 patents)
11. Alan Chapman (1 out of 1 patent)
12. Michael Lindsay (1 out of 42 patents)
13. Steve Marek (1 out of 1 patent)
14. Michael Halferty (1 out of 1 patent)
15. Jeff Tayon (1 out of 1 patent)
11 patents:
Company Overview
Orscheln Products L.L.C., headquartered in Moberly, Missouri, specializes in the development and manufacturing of advanced mechanical and electronic components. The company serves various industries, including automotive, aerospace, and agriculture, focusing on innovative solutions that enhance performance and reliability. With a commitment to quality and engineering excellence, Orscheln Products leverages its expertise in control systems and actuation technologies to meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Orscheln Products L.l.c.. Retrieved from https://idiyas.com/company/orscheln-products
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]