Forward Citations = 105

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10 inventors (with patents filed for the assignee):

John M Hale (5 out of 18 patents)

Eugen Weber (4 out of 13 patents)

Jean-Paul Pellaux (3 out of 3 patents)

4. Ion Bals (2 out of 3 patents)

5. Nicolas Gisin (1 out of 13 patents)

6. Antoine Gagnebin (1 out of 2 patents)

7. Willy Hofer (1 out of 1 patent)

8. Gerard R Stehle (1 out of 2 patents)

9. Francedillaois Gretillat (1 out of 1 patent)

10. Karin Julliard (1 out of 2 patents)

7 patents: Sort by Forward Citations

1. 5913234 - Spectroscopic method and apparatus (1999-06-15),

2. 5616826 - Photoacoustic analyzer and method (1997-04-01),

3. 5608167 - Membrane-enclosed sensor, flow control element and analytic method (1997-03-04),

4. 5545567 - Luminoscopic analytic device and method (1996-08-13),

5. 5255553 - Method and apparatus for determining specific thermal conductivity (1993-10-26),

6. 5144831 - Method and apparatus for monitoring gas concentrations (1992-09-08),

7. 5060529 - Apparatus for detecting gaseous constituents within the inner space of (1991-10-29),

Company Overview

Orbisphere Laboratories Neuchatel Sa is a leading provider of high-quality analytical instruments for measuring oxygen, carbon dioxide, and other gases in various industries. Their expertise in gas analysis technology has made them a trusted partner for customers worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

7 Patents

#87 in

#1,340 in Switzerland

CH

Orbisphere Laboratories Neuchatel Sa

Forward Citations = 105

10 inventors:

John M Hale (5 out of 18 patents)

Eugen Weber (4 out of 13 patents)

Jean-Paul Pellaux (3 out of 3 patents)

4. Ion Bals (2 out of 3 patents)

5. Nicolas Gisin (1 out of 13 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Orbisphere Laboratories Neuchatel Sa. Retrieved from https://idiyas.com/company/orbisphere-laboratories-neuchatel-sa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]