Sterling, VA, United States of America

Opterna Am, Inc.


USPTO Granted Patents = 15



Trademarks = 1

Forward Citations = 66

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33 inventors (with patents filed for the assignee):

goldMedal Biji Mathew Arakkakudy (7 out of 12 patents)

silverMedal Ravindra K Vora (6 out of 10 patents)

bronzeMedal Benoy Sarasan (6 out of 13 patents)

4.  Binoy J Puthussery (5 out of 7 patents)

5.  Gerald Joseph Meier (4 out of 7 patents)

6.  K R Suresh Nair (4 out of 8 patents)

7.  Randy Reagan (3 out of 84 patents)

8.  Kizhakkekuttu Parameswaran Chandran (3 out of 6 patents)

9.  Mathew Anjilimoottil Thomas (3 out of 4 patents)

10.  Beevi M Mohammedali (3 out of 5 patents)

11.  Panakkal Sadasivan Subin (2 out of 2 patents)

12.  Aravind Puthenveedu Jayaprakash (2 out of 2 patents)

13.  Renjith Rajan (2 out of 2 patents)

14.  Mundackal Muhammedali Beevi Kunju (2 out of 2 patents)

15.  Atikem Haile-Mariam (2 out of 3 patents)


15 patents:

Company Overview
Opterna Am, Inc. is a technology company based in Sterling, Virginia, specializing in advanced optical networking solutions. The organization focuses on developing and manufacturing innovative products that enhance data transmission and connectivity across various platforms. With a commitment to improving network efficiency and performance, Opterna operates within the telecommunications sector, providing essential tools and technologies that support the growing demands of modern communication infrastructures.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

15 Patents

#8 in Sterling, VA

#357 in Virginia

#21,068 in US

#39,959 in the World

Sterling, VA (US)
Sterling, VA, United States of America
Forward Citations = 66

33 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Opterna Am, Inc.. Retrieved from https://idiyas.com/company/opterna-am

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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