Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
8 Patents
#33 in Jerusalem
#797 in Israel
Ophir Optronics Solutions Ltd.
Forward Citations = 2
13 inventors:
Ophir Optronics Solutions Ltd.
Calculating rank
% Expired Patents = 12.5
EPO Patents = 3
Trademarks = 9
Forward Citations = 2
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13 inventors (with patents filed for the assignee):
Karol Sanilevici (3 out of 5 patents)
Alexandr Superfin (3 out of 3 patents)
Oleg Zinoviev (3 out of 3 patents)
4. Ephraim Greenfield (2 out of 5 patents)
5. Eliyahu Bender (2 out of 2 patents)
6. Shimon Elstein (2 out of 2 patents)
7. Mark Ivker (1 out of 1 patent)
8. Ephraim Rotem (1 out of 1 patent)
9. Julian Marsden (1 out of 1 patent)
10. Nahum Ahituv (1 out of 1 patent)
11. Jeff Brown (1 out of 1 patent)
12. Fon Ray Brown (1 out of 1 patent)
13. Jed Simmons (1 out of 1 patent)
14. Jeffrey L Guttman (5 patents)
15. John M Fleischer (5 patents)
8 patents:
1. 12754069 - Laser measurement apparatus having a removable and replaceable beam dump (2026-10-06),
3. 12181337 - Laser measurement apparatus having a removable and replaceable beam dump (2024-12-31),
Company Overview
Ophir Optronics Solutions Ltd. is a leading provider of precision laser measurement solutions for a wide range of industries. With a focus on accuracy and reliability, Ophir offers a comprehensive portfolio of laser power meters, energy meters, beam profilers, and thermal imaging cameras. Their products are used in research, development, manufacturing, and quality control applications worldwide.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ophir Optronics Solutions Ltd.. Retrieved from https://idiyas.com/company/ophir-optronics-solutions
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]