% Expired Patents = 33.3

Trademarks = 4

Forward Citations = 39

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8 inventors (with patents filed for the assignee):

Ephraim Greenfield (2 out of 5 patents)

Baruch Ben-Menachem (2 out of 3 patents)

Yaacov Zerem (2 out of 4 patents)

4. Nissim Asida (2 out of 3 patents)

5. Jacob Julian Vecht (2 out of 19 patents)

6. Evgeny Stolov (1 out of 2 patents)

7. Efraim Miklatzky (1 out of 7 patents)

8. Ben-Zion Halperin (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 7154077 - Device and method for measurement of incident power and energy (2006-12-26),

2. 6622599 - Precision double-sided aspheric element (2003-09-23),

3. 6460437 - Precision double-sided aspheric element (2002-10-08),

4. 5953165 - Optical aiming device (1999-09-14),

5. 5376783 - Power meter with background subtraction (1994-12-27),

6. 5357111 - Pyroelectric detector apparatus (1994-10-18),

Company Overview

Ophir Optronics Ltd. is a leading provider of precision laser measurement equipment for various industries, including medical, industrial, and defense. With over 40 years of experience, Ophir offers a wide range of products such as laser power meters, energy meters, and beam profiling cameras. Their innovative solutions help customers optimize performance and ensure safety in their laser applications.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#47 in Jerusalem

#1,039 in Israel

Jerusalem, Israel

Ophir Optronics Ltd.

Forward Citations = 39

8 inventors:

Ephraim Greenfield (2 out of 5 patents)

Baruch Ben-Menachem (2 out of 3 patents)

Yaacov Zerem (2 out of 4 patents)

4. Nissim Asida (2 out of 3 patents)

5. Jacob Julian Vecht (2 out of 19 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ophir Optronics Ltd.. Retrieved from https://idiyas.com/company/ophir-optronics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]