Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
4 Patents
#1,393 in New York, NY
#3,680 in New York
#60,641 in US
One Million Metrics Corp.
Forward Citations = 20
11 inventors:
New York, NY, United States of America
One Million Metrics Corp.
EPO Patents = 1
Trademarks = 2
Forward Citations = 20
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11 inventors (with patents filed for the assignee):
Haytham Elhawary (4 out of 24 patents)
Aditya Bansal (4 out of 20 patents)
Matthew Glazer (2 out of 2 patents)
4. Jeff Doong (2 out of 2 patents)
5. Derek Squires (2 out of 2 patents)
6. Mijael Damian (2 out of 2 patents)
7. Evan Roche (2 out of 2 patents)
8. Marina Teper (2 out of 2 patents)
9. Firdaus Janoos (2 out of 2 patents)
10. Selim Youssry (2 out of 2 patents)
11. Enrique Ruiz De Villa (1 out of 1 patent)
12. Enrique Ruiz De Villa (0 patent)
4 patents:
1. 11406289 - System and method for monitoring safety and productivity of physical tasks (2022-08-09),
2. 10772538 - System and method for monitoring safety and productivity of physical tasks (2020-09-15),
Company Overview
One Million Metrics Corp. is a data analytics company that specializes in providing businesses with actionable insights to improve their operations and decision-making processes. With a team of highly skilled data scientists and advanced technology, we help clients leverage their data to drive growth and success. Our solutions range from predictive analytics to machine learning algorithms, tailored to meet the specific needs of each client. Partner with us to unlock the power of your data and achieve measurable results.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: One Million Metrics Corp.. Retrieved from https://idiyas.com/company/one-million-metrics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]