Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
12 Patents
#5 in Mount Laurel, NJ
#961 in New Jersey
#25,540 in US
#48,129 in the World
Oki Data Americas, Inc.
Forward Citations = 203
24 inventors:
Mount Laurel, NJ, United States of America
Oki Data Americas, Inc.
% Expired Patents = 16.7
Trademarks = 3
Forward Citations = 203
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24 inventors (with patents filed for the assignee):
Barry L McElreath (3 out of 3 patents)
Dragan Sretenovic (2 out of 2 patents)
Benjamin Cuyler, Jr (2 out of 2 patents)
4. Edward Michael Hansburg (2 out of 2 patents)
5. Terry L Cruikshank (2 out of 2 patents)
6. Ronald L Bowers (2 out of 2 patents)
7. Richard F Egert, Jr (1 out of 1 patent)
8. Matthew J Davies (1 out of 1 patent)
9. Bert T Archer (1 out of 1 patent)
10. Richard Smith (1 out of 1 patent)
11. George A Rears (1 out of 1 patent)
12. Ken Gravenstede (1 out of 1 patent)
13. Mark Bratcher (1 out of 1 patent)
14. Mark Samuel Kopecki (1 out of 1 patent)
15. Ponna Arumgam (1 out of 3 patents)
12 patents:
Company Overview
Oki Data Americas, Inc. is a prominent provider of printing solutions, specializing in high-quality printers and multifunction devices tailored for various business needs. The company focuses on innovative technologies that enhance productivity and efficiency in document management. With a strong presence in the North American market, Oki Data emphasizes sustainability and cost-effectiveness in its product offerings, catering to a diverse range of industries including education, healthcare, and retail.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Oki Data Americas, Inc.. Retrieved from https://idiyas.com/company/oki-data-americas
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]