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Northville, MI, United States of America

Ois Optical Imaging Systems, Inc.

USPTO Granted Patents = 72

CIPO Patents = 1

Forward Citations = 2,749

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33 inventors (with patents filed for the assignee):

Gang Xu (24 out of 58 patents)

Willem Den Boer (24 out of 71 patents)

Adiel Abileah (24 out of 24 patents)

4. Tieer Gu (16 out of 26 patents)

5. John Z Zhong (11 out of 213 patents)

6. John A Vanderploeg (9 out of 13 patents)

7. Yiwei Lu (6 out of 60 patents)

8. Michael R Jones (6 out of 8 patents)

9. Patrick F Brinkley (6 out of 11 patents)

10. Young Hee Byun (4 out of 4 patents)

11. Vijayen S Veerasamy (3 out of 203 patents)

12. Scott V Thomsen (3 out of 113 patents)

13. Steven Aggas (3 out of 3 patents)

14. Brian K Bradford, Iii (3 out of 3 patents)

15. Paul A Voisin (3 out of 3 patents)

Core Competencies:

TFT Technology

Image Sensors

Optical Compensation

Twisted Nematic LCD

Backlit Displays

Retardation Films

High Aperture LCD

Solid State Imagers

UV Blocking Layers

Flexible Circuit Boards

Night Vision Displays

72 patents: Sort by Forward Citations

1. 6307215 - TFT array with photo-imageable insulating layer over address lines (2001-10-23),

2. 6292242 - Normally white twisted nematic LCD with positive uniaxial and negative biaxial retarders (2001-09-18),

3. 6243062 - Method and system for addressing LCD including thin film diodes (2001-06-05),

4. 6229588 - Normally white LCD including first and second biaxial retarders (2001-05-08),

5. 6229192 - Image sensor or LCD including switching pin diodes (2001-05-08),

6. 6226065 - Liquid crystal display having high contrast viewing zone centered in positive or negative vertical region (2001-05-01),

7. 6225968 - Method and system for addressing LCD including diodes (2001-05-01),

8. 6222596 - Thin film diode including carbon nitride alloy semi-insulator and method of making same (2001-04-24),

9. 6211533 - Solid state imager including TFTs with variably doped contact layer system for reducing TFT leakage current and increasing mobility (2001-04-03),

10. 6180529 - Method of making an image sensor or LCD including switching pin diodes (2001-01-30),

11. 6169590 - Liquid crystal display with optical compensator (2001-01-02),

12. 6157426 - Liquid crystal display with SiO.sub.x N.sub.y inclusive multilayer black (2000-12-05),

13. 6124907 - Liquid crystal display with internal polarizer and method of making same (2000-09-26),

14. 6124606 - Method of making a large area imager with improved signal-to-noise ratio (2000-09-26),

15. 6111622 - Day/night backlight for a liquid crystal display (2000-08-29),

Company Overview

Ois Optical Imaging Systems, Inc., based in Northville, MI, specializes in the development and manufacturing of advanced liquid crystal display technologies. The company focuses on core areas such as TFT technology, image sensors, and optical compensation, contributing to innovations in twisted nematic LCDs and backlit displays. Ois also explores high aperture LCDs and solid-state imagers, positioning itself at the forefront of optical imaging solutions that enhance visual performance across various applications.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

72 Patents

#7 in Northville, MI

#201 in Michigan

#5,101 in US

#10,383 in the World

Northville, MI, United States of America

Ois Optical Imaging Systems, Inc.

Forward Citations = 2,749

33 inventors:

Gang Xu (24 out of 58 patents)

Willem Den Boer (24 out of 71 patents)

Adiel Abileah (24 out of 24 patents)

4. Tieer Gu (16 out of 26 patents)

5. John Z Zhong (11 out of 213 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ois Optical Imaging Systems, Inc.. Retrieved from https://idiyas.com/company/ois-optical-imaging-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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