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USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#65 in Dayton, OH
#1,233 in Ohio
#29,892 in US
#56,119 in the World
Nrc Corporation
Forward Citations = 161
15 inventors:
Dayton, OH, United States of America
Nrc Corporation
Calculating rank
Trademarks = 1
Forward Citations = 161
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15 inventors (with patents filed for the assignee):
Haig Vartanian (2 out of 11 patents)
Kazuhiko Minematsu (1 out of 25 patents)
Akiko Inoue (1 out of 13 patents)
4. Alison M R Ferrie (1 out of 1 patent)
5. Marie L Mykytyshyn (1 out of 1 patent)
6. Terry Bethune (1 out of 1 patent)
7. Terrance B Tripp (1 out of 13 patents)
8. Ronald Fink (1 out of 6 patents)
9. Floyd G Speraw (1 out of 18 patents)
10. Warren W Porter (1 out of 34 patents)
11. Richard W Hildreth (1 out of 1 patent)
12. Randy J Turkal (1 out of 1 patent)
13. Daniel T Wong (1 out of 3 patents)
14. Shuzo Kato (1 out of 32 patents)
15. Noboru Watanabe (1 out of 1 patent)
10 patents:
Company Overview
Nrc Corporation, based in Dayton, Ohio, specializes in advanced technology solutions and engineering services. The company focuses on developing innovative products and systems across various sectors, including aerospace, defense, and industrial applications. With a commitment to research and development, Nrc Corporation leverages cutting-edge technologies to enhance performance and efficiency in its offerings. The organization is dedicated to meeting the evolving needs of its clients through tailored solutions and expert engineering capabilities.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nrc Corporation. Retrieved from https://idiyas.com/company/nrc
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]