For the Inventor, By the Inventor

Enter assignee name

Niigata Univerasity

USPTO Granted Patents = 1

Forward Citations = 0

Loading Chart...

Loading Chart...

4 inventors (with patents filed for the assignee):

Terutaka Goto (1 out of 3 patents)

Hiroshi Kaneta (1 out of 3 patents)

Yuichi Nemoto (1 out of 3 patents)

4. Mitsuhiro Akatsu (1 out of 1 patent)

1 patent: Sort by Forward Citations

1. 8578777 - Method for quantitatively evaluating concentration of atomic vacancies existing in silicon wafer, method for manufacturing silicon wafer, and silicon wafer manufactured by the method for manufacturing silicon wafer (2013-11-12),

Company Badge

USPTO Data Jan 1 1976 - Dec 16 2025

1 Patents

#58 in Niigata

#15,596 in Japan

Niigata Univerasity

Forward Citations = 0

4 inventors:

Terutaka Goto (1 out of 3 patents)

Hiroshi Kaneta (1 out of 3 patents)

Yuichi Nemoto (1 out of 3 patents)

4. Mitsuhiro Akatsu (1 out of 1 patent)

Please report any incorrect information to support@idiyas.com

Loading…