Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
16 Patents
#2 in Kiel, WI
#463 in Wisconsin
#19,944 in US
#37,887 in the World
Nigrelli Systems, Inc.
Forward Citations = 178
14 inventors:
Kiel, WI, United States of America
Nigrelli Systems, Inc.
Calculating rank
% Expired Patents = 6.3
Trademarks = 2
Forward Citations = 178
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14 inventors (with patents filed for the assignee):
Brian L Thelen (4 out of 5 patents)
David E Wasmer (3 out of 4 patents)
Dennis L Ramaker (3 out of 4 patents)
4. Nicholas B Nigrelli (3 out of 5 patents)
5. Wayne S Lutzke (2 out of 3 patents)
6. Michael A Balz (2 out of 2 patents)
7. Brian J Hanke (1 out of 1 patent)
8. Mike E Grunwald (1 out of 1 patent)
9. Gary D Tanck (1 out of 1 patent)
10. Biagio J Nigrelli, Sr (1 out of 8 patents)
11. Nicholas R Nigrelli (1 out of 1 patent)
12. Thomas Schumacher (1 out of 1 patent)
13. Terry J Nigrelli (1 out of 4 patents)
14. Michael Meives (1 out of 1 patent)
16 patents:
Company Overview
Nigrelli Systems, Inc. is a technology company based in Kiel, Wisconsin, specializing in advanced engineering solutions and innovative product development. The organization focuses on creating high-quality systems and components for various industries, including automotive and industrial applications. With a commitment to research and development, Nigrelli Systems leverages cutting-edge technology to enhance performance and efficiency in its offerings, positioning itself as a key player in the engineering landscape.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nigrelli Systems, Inc.. Retrieved from https://idiyas.com/company/nigrelli-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]