Elyria, OH, United States of America

Nelson Stud Welding, Inc.

USPTO Granted Patents = 21

% Expired Patents = 14.3


Trademarks = 10

Forward Citations = 100

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19 inventors (with patents filed for the assignee):

goldMedal Jeffrey Krupp (6 out of 7 patents)

silverMedal Clark B Champney (5 out of 5 patents)

bronzeMedal Larry L Church (4 out of 15 patents)

4.  Christopher Hsu (4 out of 96 patents)

5.  William C Easterday (4 out of 4 patents)

6.  Scott J Schraff (3 out of 3 patents)

7.  Stephen D Brooks (3 out of 3 patents)

8.  Kay Sichtermann (2 out of 2 patents)

9.  Klaus E Jost (2 out of 2 patents)

10.  Christopher S Landek-Riker (2 out of 2 patents)

11.  Steven E Armbruster (2 out of 2 patents)

12.  James W Mumaw (1 out of 4 patents)

13.  Ian Houston (1 out of 1 patent)

14.  Jon Edgar (1 out of 1 patent)

15.  Cornel Irimies (1 out of 1 patent)


21 patents:

Company Overview
Nelson Stud Welding, Inc. is a leading provider of innovative stud welding solutions, specializing in the development and manufacturing of high-quality welding equipment and fasteners. The company focuses on advanced technologies that enhance the efficiency and reliability of welding processes across various industries, including construction, automotive, and manufacturing. With a commitment to quality and performance, Nelson Stud Welding serves a global market from its headquarters in Elyria, Ohio, delivering solutions that meet the evolving needs of its customers.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

21 Patents

#8 in Elyria, OH

#681 in Ohio

#15,712 in US

#30,001 in the World

Elyria, OH (US)
Elyria, OH, United States of America
Forward Citations = 100

19 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nelson Stud Welding, Inc.. Retrieved from https://idiyas.com/company/nelson-stud-welding

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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