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For the Inventor, By the Inventor

Tokyo, Japan

Nas Giken Inc.


USPTO Granted Patents = 1

Forward Citations = 1

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2 inventors (with patents filed for the assignee):

goldMedal Yoshio Sakurai (1 out of 4 patents)

silverMedal Yutaka Ogawa (1 out of 14 patents)


1 patent:

1. 7685895 - Substrate inspection device, substrate inspection method, and recovery tool (2010-03-30),
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USPTO Data Jan 1 1976 - Jan 6 2026

1 Patents

#5,734 in Tokyo

#15,549 in Japan

...
Tokyo, Japan

Nas Giken Inc.

Forward Citations = 1

2 inventors:

goldMedal Yoshio Sakurai (1 out of 4 patents)

silverMedal Yutaka Ogawa (1 out of 14 patents)

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