Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
5 Patents
#3 in Christiansburg, VA
#925 in Virginia
#51,644 in US
Nanoscale Materials, Inc.
Forward Citations = 167
13 inventors:
Christiansburg, VA, United States of America
Nanoscale Materials, Inc.
% Expired Patents = 40.0
CIPO Patents = 1
Trademarks = 5
Forward Citations = 167
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13 inventors (with patents filed for the assignee):
Olga B Koper (4 out of 20 patents)
Kenneth J Klabunde (4 out of 28 patents)
Slawomir Winecki (2 out of 26 patents)
4. Paul S Malchesky (2 out of 33 patents)
5. Shyamala Rajagopalan (2 out of 4 patents)
6. Lisa S Martin (1 out of 4 patents)
7. Kyle B Knappenberger (1 out of 7 patents)
8. Laura L Hladky (1 out of 3 patents)
9. Shawn P Decker (1 out of 6 patents)
10. John S Klabunde (1 out of 3 patents)
11. Jennifer Hoyt Lalli (1 out of 1 patent)
12. Jiyun Huie (1 out of 1 patent)
13. Ben Lepene (1 out of 1 patent)
14. Amy Elizabeth Quiring (9 patents)
15. Christopher L Aikens (2 patents)
5 patents:
Company Overview
Nanoscale Materials, Inc. is a leading provider of advanced nanomaterials for a wide range of industries, including electronics, healthcare, and energy. Our cutting-edge research and development capabilities allow us to create customized solutions to meet our customers' unique needs. With a commitment to innovation and quality, we strive to push the boundaries of nanotechnology to drive progress and create a sustainable future.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nanoscale Materials, Inc.. Retrieved from https://idiyas.com/company/nanoscale-materials
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]