Nanoform Finland Oyj

Calculating rank

USPTO Granted Patents = 4

% Expired Patents = 25.0

CIPO Patents = 1

EPO Patents = 3

Trademarks = 6

Forward Citations = 1

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14 inventors (with patents filed for the assignee):

Niklas Sandler (2 out of 4 patents)

Ilkka Lassila (2 out of 3 patents)

Sami Svanbäck (1 out of 4 patents)

4. Jouko Yliruusi (1 out of 7 patents)

5. Ivan Kassamakov (1 out of 4 patents)

6. Anton Nolvi (1 out of 2 patents)

7. Tapani Viitala (1 out of 2 patents)

8. Edward Hæggström (1 out of 4 patents)

9. Johan Nyman (1 out of 2 patents)

10. Jenni Pessi (1 out of 2 patents)

11. Tatiana Danilova (1 out of 1 patent)

12. Nikolay Houbenov (1 out of 1 patent)

13. Eric Kissi (1 out of 1 patent)

14. Martti Kaasalainen (1 out of 1 patent)

15. Edward Haeggström (13 patents)

4 patents: Sort by Forward Citations

1. 12303845 - Method for crystallization of active pharmaceutical ingredients (2025-05-20),

2. 11766650 - System and method to produce particles of organic substances (2023-09-26),

3. 11422121 - Device, method and kit for dissolution testing (2022-08-23),

4. 10839558 - Artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves (2020-11-17),

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

4 Patents

#163 in Helsinki

#646 in Finland

Helsinki, Finland

Nanoform Finland Oyj

Forward Citations = 1

14 inventors:

Niklas Sandler (2 out of 4 patents)

Ilkka Lassila (2 out of 3 patents)

Sami Svanbäck (1 out of 4 patents)

4. Jouko Yliruusi (1 out of 7 patents)

5. Ivan Kassamakov (1 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nanoform Finland Oyj. Retrieved from https://idiyas.com/company/nanoform-finland-oyj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]