Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
12 Patents
#222 in Hsinchu
#1,243 in Taiwan
#48,163 in the World
Nano Precision Taiwan Limited
Forward Citations = 11
20 inventors:
Nano Precision Taiwan Limited
% Expired Patents = 16.7
Forward Citations = 11
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20 inventors (with patents filed for the assignee):
Fang-Hsuan Su (5 out of 10 patents)
Chi-Tang Hsieh (4 out of 85 patents)
Shu-Ping Yang (4 out of 4 patents)
4. Hao-Jan Kuo (4 out of 10 patents)
5. Chao-Hung Weng (4 out of 19 patents)
6. Ching-Hsiang Li (4 out of 11 patents)
7. Fu-Chiang Hsu (4 out of 6 patents)
8. Kuan-Wen Liu (2 out of 4 patents)
9. Ming-Ta Ke (2 out of 2 patents)
10. Shih-Yuan Liu (2 out of 2 patents)
11. Ming-Dah Liu (2 out of 20 patents)
12. Hung-Ta Chien (1 out of 16 patents)
13. Hung-Tse Lin (1 out of 2 patents)
14. Chi-Lung Lee (1 out of 1 patent)
15. Wan-Jung Li (1 out of 1 patent)
12 patents:
Company Overview
Nano Precision Taiwan Limited is a pioneering company based in Hsinchu, Taiwan, specializing in advanced precision engineering and manufacturing solutions. The organization focuses on developing cutting-edge technologies for various applications, including semiconductor equipment, optical components, and precision measurement systems. With a commitment to innovation, Nano Precision aims to enhance performance and reliability in high-tech industries, contributing significantly to the advancement of precision manufacturing and technology on a global scale.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nano Precision Taiwan Limited. Retrieved from https://idiyas.com/company/nano-precision-taiwan
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]