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USPTO Data Jan 1 1976 - Oct 20 2026
117 Patents
#2 in Kessel-lo
#43 in Belgium
#6,803 in the World
N.v. Raychem S.a.
Forward Citations = 2,517
108 inventors:
N.v. Raychem S.a.
Forward Citations = 2,517
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108 inventors (with patents filed for the assignee):
Jean-Marie E Nolf (19 out of 30 patents)
Alain Wambeke (10 out of 14 patents)
Jan L Vansant (9 out of 20 patents)
4. Lodewijk Cordula Van Noten (8 out of 18 patents)
5. Valere Buekers (7 out of 13 patents)
6. Johannes M Cordia (7 out of 7 patents)
7. Marc F Moisson (7 out of 8 patents)
8. Etienne R Laeremans (6 out of 7 patents)
9. Joris I Franckx (6 out of 13 patents)
10. Jesper Damm (5 out of 5 patents)
11. Robert H Van Loo (5 out of 5 patents)
12. Joris R Franckx (5 out of 10 patents)
13. Noel K Overbergh (5 out of 8 patents)
14. Marc Demesmaeker (5 out of 6 patents)
15. Luk Jozef Macken (5 out of 5 patents)
Core Competencies:
Environmental Protection
Cable Seal
Optical Fibre Organizer
Sealing Device
Corrosion Protection
Curable Adhesive
Heat Shrinkable Wrap
Moisture Detection
Electrical Connector
Recoverable Fabric Sleeve
Splice Closure
Duct Sealing
117 patents:
Company Overview
N.v. Raychem S.a., headquartered in Kessel-lo, Belgium, specializes in advanced environmental sealing technologies. The company focuses on developing innovative solutions for environmental protection, including cable seals and sealing devices that enhance durability and reliability in various applications. Their expertise extends to optical fibre organizers, corrosion protection, and curable adhesives, as well as heat shrinkable wraps and moisture detection systems, catering to industries that demand high-performance sealing solutions.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: N.v. Raychem S.a.. Retrieved from https://idiyas.com/company/n-v-raychem-s-a
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]